Event Date: Friday, July 21, 2023 at 1:00 – 2:00 p.m.
Event Location: ECSS 3.910 John von Neumann Room
To learn more about TxACE e-Seminar click here.
Month: June 2023
Addressing the Data Challenge in Machine Learning Based Circuit Failure Detection and Wafer Pattern Recognition
Event Date: Friday, June 23, 2023 at 1:00 – 2:00 p.m.
Event Location: ECSS 3.910 John von Neumann Room
To learn more about TxACE e-Seminar click here